ISO INTERNATIONAL STANDARD 21222 First edition 2020-01 Surface chemical analysis - Scanning probe microscopy Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method Analyse chimique des surfaces - Microscopie a sonde locale - Lignes directrices pour la determination des modules d'élasticite des matériaux souples en utilisant un microscope a force atomique Reference number ISO 21222:2020(E) OST @ IS0 2020 IS0 21222:2020(E) COPYRIGHTPROTECTEDDOCUMENT IS0 2020 All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may below or Iso's member body in the country of the requester. ISO copyright office CP 401 : Ch. de Blandonnet 8 CH-1214 Vernier, Geneva Phone: +41 22 749 01 11 Fax: +41 22 749 09 47 Email: [email protected] Website: www.iso.org Published in Switzerland ii @ IS0 2020 - All rights reserved